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A variable-angle spectroscopic ellipsometer (VASE) is an essential tool for measuring the thickness of a thin film, as well as its n and k optical parameters. However, for films thinner than 10 nm, ...

The ellipsometer is capable of measuring film thicknesses and index of refraction of stacks of thin films including dielectrics.

Authors: Zhimin Zhu; Xianggui Ye; Sean Simmons; Catherine Frank; Tim Limmer; James Lamb Brewer Science, Inc. (United States) A variable-angle spectroscopic ellipsometer (VASE) is an essential tool for ...

SAN ANTONIO -- Feb. 3, 2020 -- Southwest Research Institute has created a new test that significantly reduces the time and fuel needed to evaluate the formation of internal deposits on diesel engine ...

An optical instrument that uses the polarization state of reflected light to determine the thichness and optical constants of thin dielectric films. Used to characterize optical coatings.

Ellipsometry is a technique used to characterize optical properties and thicknesses of thin films by measuring the change in polarization state of light reflected from the surface of (or through) a ...