GamesRadar+

Transistor Test Challenge Room guide

There are 7 planning tests in total and in each one the challenge is to destroy the Process in a single turn. As with the speed test, the functions are arranged in a preset loadout that will tip you ...
Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Electronic Design

This Crucial WBG Power Transistor Reliability Test is Often Missing

There is a great deal of activity in wide bandgap (WBG) power electronics lately, with Gallium Nitride (GaN) and Silicon Carbide (SiC) devices getting a lot of attention due to the technologies’ ...
EDN

Transistors slim down to test new materials for chip-making processes

Researchers at the IMEC research institute in Belgium are developing a transistor with a gate width of 22nm (0.022µm) and a gate thickness of 0.5nm to test out new materials for future commercial chip ...
EDN

1st successful test of the transistor, December 16, 1947

What began as research to improve telephone service became one of the most important inventions in electronics history. In 1945, AT&T’s research division, Bell Labs, began working on technology to ...
GamesRadar+

Transistor Test Challenge Room guide

The Speed test is a time attack but as you progress through the 6 arenas, you’ll soon discover that passing or failing hinges on your planning technique. Running around in real time bludgeoning ...